The System profiler contains the following updates:
- Function labels were added to the Timeline view to annotate every
function entry and exit event in the Timeline view with their
corresponding function name (see Timeline view).
- Previously, the Timeline event label data selection dialog only allowed
you to choose an event type and a single data key, and now, you can
select multiple data keys, as well as define whether you want to
customize the display pattern for labels (see "Event labels" in Timeline view).
- The IDE now has the ability to import part of a trace into the
Application Profiler so that only the selected portion of the kernel
trace will be imported (see Importing part of a kernel trace into the Application Profiler).
- A simplified method of performing a source lookup (address translation)
was incorporated into the launch configuration so that you don't
have to do it for each .kev file (see Address translation).
- Partition based filtering also allows the current editor panes and views
that support filtering to only show data related to partitions that
you specify. For example, the Trace Event Log only shows events that
occurred for those partitions that you specify.
- You can perform filtering in Statistics views.
- The IDE includes selection-based partition summary statistics.